相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Emerging multi-frequency surface strain force microscopy
Qibin Zeng et al.
JOURNAL OF APPLIED PHYSICS (2023)
The effect of sample viscoelastic properties and cantilever amplitudes on maximum repulsive force, indentation, and energy dissipation in bimodal AFM
Mehrnoosh Damircheli et al.
PHYSICA SCRIPTA (2023)
Fundamental and higher eigenmodes of qPlus sensors with a long probe for vertical-lateral bimodal atomic force microscopy
Yuya Yamada et al.
NANOSCALE ADVANCES (2023)
Probing power laws in multifrequency AFM
Sergio Santos et al.
APPLIED PHYSICS LETTERS (2023)
Nonlinear vibration behaviors of dielectric elastomer membranes under multi-frequency excitations
Amin Alibakhshi et al.
SENSORS AND ACTUATORS A-PHYSICAL (2023)
Torsional and lateral eigenmode oscillations for atomic resolution imaging of HOPG in air under ambient conditions
Anna L. Eichhorn et al.
SCIENTIFIC REPORTS (2022)
In-plane and out-of-plane interaction analysis of adsorbates on multilayer graphene and graphite by multifrequency atomic force microscopy
Anna L. Eichhorn et al.
CARBON (2022)
Van der Waals heterostructures
Andres Castellanos-Gomez et al.
NATURE REVIEWS METHODS PRIMERS (2022)
Chemical bond imaging using torsional and flexural higher eigenmodes of qPlus sensors
Daniel Martin-Jimenez et al.
NANOSCALE (2022)
Accurate Wide-Modulus-Range Nanomechanical Mapping of Ultrathin Interfaces with Bimodal Atomic Force Microscopy
Victor G. Gisbert et al.
ACS NANO (2021)
High-Speed Nanomechanical Mapping of the Early Stages of Collagen Growth by Bimodal Force Microscopy
Victor G. Gisbert et al.
ACS NANO (2021)
Simultaneous Deconvolution of In-Plane and Out-of-Plane Forces of HOPG at the Atomic Scale under Ambient Conditions by Multifrequency Atomic Force Microscopy
Anna L. Eichhorn et al.
ADVANCED MATERIALS INTERFACES (2021)
Interface nano-optics with van der Waals polaritons
Qing Zhang et al.
NATURE (2021)
Nanophotonic biosensors harnessing van der Waals materials
Sang-Hyun Oh et al.
NATURE COMMUNICATIONS (2021)
Discrimination of adhesion and viscoelasticity from nanoscale maps of polymer surfaces using bimodal atomic force microscopy
Bahram Rajabifar et al.
NANOSCALE (2021)
Naturally occurring van der Waals materials
Riccardo Frisenda et al.
NPJ 2D MATERIALS AND APPLICATIONS (2020)
Van der Waals integration before and beyond two-dimensional materials
Yuan Liu et al.
NATURE (2019)
Energy dissipation in van der Waals 2D devices
Zhun-Yong Ong et al.
2D MATERIALS (2019)
Fast, quantitative and high resolution mapping of viscoelastic properties with bimodal AFM
Simone Benaglia et al.
NANOSCALE (2019)
Fast, High Resolution, and Wide Modulus Range Nanomechanical Mapping with Bimoda Tapping Mode
Math Kocun et al.
ACS NANO (2017)
Rapid quantitative chemical mapping of surfaces with sub-2 nm resolution
Chia-Yun Lai et al.
NANOSCALE (2016)
Generalized Hertz model for bimodal nanomechanical mapping
Aleksander Labuda et al.
BEILSTEIN JOURNAL OF NANOTECHNOLOGY (2016)
Van der Waals heterostructures and devices
Yuan Liu et al.
NATURE REVIEWS MATERIALS (2016)
Mapping power-law rheology of living cells using multi-frequency force modulation atomic force microscopy
Ryosuke Takahashi et al.
APPLIED PHYSICS LETTERS (2015)
Quantitative measurement of the mechanical properties of human antibodies with sub-10-nm resolution in a liquid environment
Agnieszka Voss et al.
NANO RESEARCH (2015)
Fast nanomechanical spectroscopy of soft matter
Elena T. Herruzo et al.
NATURE COMMUNICATIONS (2014)
Trade-offs in sensitivity and sampling depth in bimodal atomic force microscopy and comparison to the trimodal case
Babak Eslami et al.
BEILSTEIN JOURNAL OF NANOTECHNOLOGY (2014)
The emergence of multifrequency force microscopy
Ricardo Garcia et al.
NATURE NANOTECHNOLOGY (2012)
Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus
Elena T. Herruzo et al.
BEILSTEIN JOURNAL OF NANOTECHNOLOGY (2012)
Force spectroscopy using bimodal frequency modulation atomic force microscopy
M. Deniz Aksoy et al.
PHYSICAL REVIEW B (2011)
Triple-frequency intermittent contact atomic force microscopy characterization: Simultaneous topographical, phase, and frequency shift contrast in ambient air
Santiago D. Solares et al.
JOURNAL OF APPLIED PHYSICS (2010)
Frequency response of higher cantilever eigenmodes in bimodal and trimodal tapping mode atomic force microscopy
Santiago D. Solares et al.
MEASUREMENT SCIENCE AND TECHNOLOGY (2010)
Quantitative force versus distance measurements in amplitude modulation AFM: a novel force inversion technique
Allard J. Katan et al.
NANOTECHNOLOGY (2009)
Systematic Achievement of Improved Atomic-Scale Contrast via Bimodal Dynamic Force Microscopy
Shigeki Kawai et al.
PHYSICAL REVIEW LETTERS (2009)
Theory of multifrequency atomic force microscopy
Jose R. Lozano et al.
PHYSICAL REVIEW LETTERS (2008)
Enhanced compositional sensitivity in atomic force microscopy by the excitation of the first two flexural modes
N. F. Martinez et al.
APPLIED PHYSICS LETTERS (2006)
Multifrequency, repulsive-mode amplitude-modulated atomic force microscopy
Roger Proksch
APPLIED PHYSICS LETTERS (2006)
Identification of nanoscale dissipation processes by dynamic atomic force microscopy
R. Garcia et al.
PHYSICAL REVIEW LETTERS (2006)
Quantitative force measurements using frequency modulation atomic force microscopy - theoretical foundations
JE Sader et al.
NANOTECHNOLOGY (2005)
Accurate formulas for interaction force and energy in frequency modulation force spectroscopy
JE Sader et al.
APPLIED PHYSICS LETTERS (2004)
Spectroscopy of higher harmonics in dynamic atomic force microscopy
RW Stark
NANOTECHNOLOGY (2004)
Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever
TR Rodríguez et al.
APPLIED PHYSICS LETTERS (2004)
Interpretation of frequency modulation atomic force microscopy in terms of fractional calculus
JE Sader et al.
PHYSICAL REVIEW B (2004)
Tip-surface forces, amplitude, and energy dissipation in amplitude-modulation (tapping mode) force microscopy -: art. no. 193411
A San Paulo et al.
PHYSICAL REVIEW B (2001)
Physical interpretation of frequency-modulation atomic force microscopy
FJ Giessibl et al.
PHYSICAL REVIEW B (2000)