4.7 Article

Effect of excess of bismuth doping on dielectric and ferroelectric properties of BaBi4Ti4O15 ceramics

期刊

CERAMICS INTERNATIONAL
卷 41, 期 3, 页码 4189-4198

出版社

ELSEVIER SCI LTD
DOI: 10.1016/j.ceramint.2014.12.103

关键词

Relaxor ferroelectrics; Dielectric behavior; V-F fit; P-E measurements

资金

  1. University of Delhi [DRCH/R&D/2013-2014/4155]
  2. Council of Scientific and Industrial Research (CSIR), India [09/045(0961)/2010-EMR-1]

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The effect of excess bismuth oxide Bi2O3 (2-10 wt%) for processing BaBi4Ti4O15 (BBT) ceramics by solid state reaction has been investigated. The formation of a single phase and a change in the orthorhombic distortion are confirmed with varying excess of bismuth content. Changes in the density are marginal, and use of excess bismuth is seen to promote enhanced grain growth. Dielectric response is improved markedly exhibiting reduced dielectric losses and dispersion over a wide frequency range (10(-3)-10(6) Hz). A high dielectric constant (epsilon' 226), low loss factor (tan delta similar to 0.01) and low dc conductivity (sigma(dc)similar to 10(-14) Omega(-1) cm(-1)) are achieved with an optimum content 6-8 wt% of excess of bismuth oxide. Temperature dependent dielectric data fits well to the modified Curie-Weiss law and the frequency dependent maximum temperatures (T-m and T-m1) corresponding to real and imaginary parts of dielectric permittivity (epsilon' and epsilon '') show a good fit to the non-linear Vogel-Fulcher (V-F) relationship. A clear relaxor behavior is observed with a degree of diffuseness, gamma similar to 1.97. Saturated hysteresis loops with high remnant polarization (P-r similar to 12.5 mu C/cm(2)), low coercive fields (E-c similar to 26 kV/cm) are measured and a high piezoelectric coefficient (d(33)similar to 29 pC/N) is achieved in poled BaBi4Ti4O15 ceramics prepared with up to 8 wt% of excess bismuth oxide. Such a relaxor ferroelectric material with high Curie temperature is useful for high temperature piezoelectric transducer applications. (C) 2014 Elsevier Ltd and Techna Group S.r.l. All rights reserved.

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