期刊
IEEE PHOTONICS TECHNOLOGY LETTERS
卷 35, 期 12, 页码 676-679出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LPT.2023.3270200
关键词
Diffraction; Laser beams; Measurement by laser beam; Extraterrestrial measurements; Apertures; Length measurement; Size measurement; Laguerre-Gaussian beam; topological charge; Y-shaped aperture
This letter studies the diffraction pattern of a Laguerre-Gaussian (LG) beam passing through a Y-shaped aperture (YA) for measuring the topological charge (TC) of the beam. It confirms that the magnitude and sign of TC can be measured using YA, and investigates the effect of YA size on the diffraction pattern. The diffraction of YA itself can also verify the sign of TC, and the experimental results agree well with simulations. The method is simple and reliable.
We study the diffraction pattern of a Laguerre-Gaussian (LG) beam passing through a Y-shaped aperture (YA), which can be used to measure the topological charge (TC) of such a beam. This letter confirms that the magnitude and sign of the TC of the LG beam can be measured with a YA. We also study the effect of the YA with different sizes on the diffraction pattern. In addition, YA diffraction itself can be used to verify the measurement results of the sign of TC. The experimental results agree well with the simulation results. The method is simple and reliable.
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