4.4 Article

Inline Photothermal Surface Plasmon Detector Integrated in Titanium Dioxide Waveguides

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IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JQE.2023.3244281

关键词

Strips; Metals; Optical waveguides; Gold; Detectors; Optical detectors; Titanium dioxide; Integrated photodetectors; integrated photonics; optical sensors; photothermal effects; surface plasmon polaritons

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This work presents the realization of an in-line Surface Plasmon Detector (SPD) that utilizes the photothermal effect to monitor the optical power in a titanium dioxide (TiO2) optical waveguide. Detailed design guidelines are provided to maximize the responsivity of the SPD, considering the effects of the metal geometry on the coupling between the dielectric and plasmonic modes, the power dissipated in the metal, and the equivalent thermal resistance of the structure. Experimental validation is provided for an ultra-compact 1.6-μm-long SPD operating at a wavelength of 1550 nm with a sensitivity of -20 dBm and a bandwidth higher than 100 kHz. The proposed device concept can be applied to generic dielectric platforms and other wavelength ranges where SPP propagation is supported.
Densely integrated photonic integrated circuits (PICs) require efficient solutions for monitoring the light intensity on chip in order to implement control and configuration operations to set and stabilize the working point of the circuit. To this end, waveguides supporting the propagation of surface plasmon polaritons (SPPs) are good candidates to realize smallfootprint light detectors. In this work, we report on the realization of an in-line Surface Plasmon Detector (SPD) that exploits the photothermal effect to monitor the optical power in a titanium dioxide (TiO2) optical waveguide. Detailed design guidelines are provided to maximize the responsivity of the SPD, taking into account the effects of the metal geometry on the coupling between the dielectric and plasmonic modes, the power dissipated in the metal, and the equivalent thermal resistance of the structure. Experimental validation of the proposed device is provided demonstrating an ultra-compact 1.6-mu m-long SPD operating at a wavelength of 1550 nm with a sensitivity of-20 dBm and a bandwidth higher than 100 kHz. The proposed device concept can be ported to generic dielectric platforms and to other wavelength ranges where SPP propagation is supported.

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