4.7 Article

Fabrication and thermoelectric properties of CuMn1+xO2 (x=0∼0.2) ceramics

期刊

CERAMICS INTERNATIONAL
卷 41, 期 9, 页码 12303-12309

出版社

ELSEVIER SCI LTD
DOI: 10.1016/j.ceramint.2015.06.058

关键词

CuMnO2; Crednerite; Layer structure; Thermoelectric properties

资金

  1. National Science Council of Taiwan, ROC [NSC 100-2221-E-006-129-MY3]

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Crednerite CuMnO2 ceramic has been investigated for the first time in this study as a potential thermoelectric material based on its low band gap and layer structure. Undoped CuMn1+xO2 (0 <= x <= 0.2) samples with a delafossite structure were prepared via solid-state reactions and sintered at 1353 K for 2.5 h in argon. The phase, microstructure, and thermoelectric properties of the CuMn1+xO2 (0 <= x <= 0.2)samples were discussed by adjusting the sample composition. The crystallinity and microstructure of sintered bulks were analyzed using X-ray diffraction and scanning electron microscopy, respectively. The thermoelectric properties of the samples were studied from room temperature to 573 K. CuMn1+xO2 sintered bulks showed a relative density of 91% and a layered structure. The composition affected the phases and thermoelectric properties of sintered bulks. Bulks with the crednerite CuMnO2 phase were only obtained at x=0.1 or 0.143. The crednerite CuMn1+xO2 (0 <= x <= 0.2) samples were p-type semiconductors. The Seebeck coefficient (S) increased and the electrical conductivity (sigma) decreased with Mn content up to x=0.1. Excess Mn content (x>0.143) decreased the Seebeck coefficient and increased electrical conductivity. The power factor (PF) of the CuMn1+xO2 (0 <= x <= 0.2) samples improved due to the significant increase in the Seebeck coefficient. The thermal conductivity (K) decreased with increasing temperature. The lowest kappa value (6.79 W m(-1) K-1) was found for the CuMn1.1O2 sample at 573 K. The dimensionless figure of merit ZT values of the undoped CuMn1+xO2 bulks are too small for these bulks to be candidates for thermoelectric materials due to weak electrical conductivity. (C) 2015 Elsevier Ltd and Techna Group S.r.l. All rights reserved.

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