Photosensitivity of CuBiSe2 Thin Film Deposited by Vacuum Evaporation Technique

CuBiSe2 (CBSe) thin film was prepared by vacuum evaporation. The deposited film was characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive X-ray (EDX), UV-visible specroscopy, and I-V analysis. XRD analysis indicates the formation of cubic CBSe thin film, and the corresponding EDX spectrum confirms the stoichiometry composition of CBSe. In the AFM images, the majority of the particles are granular, and the surface roughness is 8.86 nm. The optical absorption coefficient is >10(4) in the visible region and the bandgap energy is calculated to be 1.84 eV. The photosensitivity of the film is 181%.