4.8 Article

Reconfigurable logic-in-memory architectures based on a two-dimensional van der Waals heterostructure device

期刊

NATURE ELECTRONICS
卷 5, 期 11, 页码 752-+

出版社

NATURE PORTFOLIO
DOI: 10.1038/s41928-022-00858-z

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资金

  1. National Natural Science Foundation of China [51902098, 52221001, U19A2090, 62090035, 51972105, U1930114, 51991341]
  2. Key Program of Science and Technology Department of Hunan Province [2019XK2001, 2020XK2001]
  3. Science and Technology Innovation Program of Hunan Province [2021RC3061, 2020RC2028, 2021RC2042]
  4. Natural Science Foundation of Hunan Province [2021JJ20016, 2021JJ30132]
  5. China Postdoctoral Science Foundation [BX2021094, 2020M680112, 2021M690953]
  6. National Key R&D Program of China [2021YFA1200503]

向作者/读者索取更多资源

This article introduces a van der Waals heterostructure with a partial floating-gate field-effect transistor device architecture that can function as both a reconfigurable transistor and a reconfigurable non-volatile memory, and can provide reconfigurable logic-in-memory capabilities.
A van der Waals heterostructure that has a partial floating-gate field-effect transistor device architecture can function as both reconfigurable transistor and reconfigurable non-volatile memory, and can provide reconfigurable logic-in-memory capabilities. Logic-in-memory architectures could be used to develop efficient computing devices with low power consumption. However, the approach is limited by device performance issues, including reliability and versatility. Here we report a two-dimensional van der Waals heterostructure device that can function as both reconfigurable transistor and reconfigurable non-volatile memory, as well as provide reconfigurable logic-in-memory capabilities. The architecture of the device-termed a partial floating-gate field-effect transistor-offers both charge-trapping and field-regulating units. When operating as a transistor, the device can be switched between the p- and n-type mode, and exhibits a subthreshold swing of 64 mV dec(-1) and on/off current ratio approaching 10(8). When operating as a memory, the device can be switched between the p- and n-type memory, and exhibits an erase/program ratio approaching 10(8). We use the devices to fabricate complementary metal-oxide-semiconductor circuits, and linear and nonlinear logic gates with in situ storage, as well as device-efficient half-adder circuits.

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