期刊
MATERIALS
卷 15, 期 24, 页码 -出版社
MDPI
DOI: 10.3390/ma15248973
关键词
copper nitride; reactive RF magnetron sputtering; gaseous environment; solar absorber
This study fabricated copper nitride films using reactive radio frequency magnetron sputtering and investigated the role of argon in the microstructure and optoelectronic properties of the films. The results showed that argon had an influence on the preferential orientation of the films, while no structural changes were observed in films deposited in a pure nitrogen environment. The optical properties of the films were also evaluated, indicating the potential of this material as a solar absorber.
Copper nitride, a metastable semiconductor material with high stability at room temperature, is attracting considerable attention as a potential next-generation earth-abundant thin-film solar absorber. Moreover, its non-toxicity makes it an interesting eco-friendly material. In this work, copper nitride films were fabricated using reactive radio frequency (RF) magnetron sputtering at room temperature, 50 W of RF power, and partial nitrogen pressures of 0.8 and 1.0 on glass and silicon substrates. The role of argon in both the microstructure and the optoelectronic properties of the films was investigated with the aim of achieving a low-cost absorber material with suitable properties to replace the conventional silicon in solar cells. The results showed a change in the preferential orientation from (100) to (111) planes when argon was introduced in the sputtering process. Additionally, no structural changes were observed in the films deposited in a pure nitrogen environment. Fourier transform infrared (FTIR) spectroscopy measurements confirmed the presence of Cu-N bonds, regardless of the gas environment used, and XPS indicated that the material was mainly N-rich. Finally, optical properties such as band gap energy and refractive index were assessed to establish the capability of this material as a solar absorber. The direct and indirect band gap energies were evaluated and found to be in the range of 1.70-1.90 eV and 1.05-1.65 eV, respectively, highlighting a slight blue shift when the films were deposited in the mixed gaseous environment as the total pressure increased.
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