期刊
JOURNAL OF PHYSICS D-APPLIED PHYSICS
卷 49, 期 5, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/0022-3727/49/5/055104
关键词
thin films; perfect absorbers; photonics
资金
- Greek General Secretariat for Research and Technology via the Greek-German bilateral project SolarNano
- project EXEL [ERC02]
- European Research Council [320081]
- Slovak Research and Development Agency [VEGA 1/0372/13, APVV-0108/11]
- US Department of Energy (Basic Energy Science, Division of Materials Science and Engineering) [DE-AC02-07CH11358]
We present a rigorous study of the perfect absorption properties of metal-insulator-metal (MIM) structures in the visible spectrum. We provide a derivation (based on the transfer matrix method) and analysis of the conditions for which the perfect absorption occurs. We show that these conditions are fulfilled when the incident wave excites the eigen-modes of the structure. The quantitative analysis allows us to design specific perfect absorbers for our needs. The analytical model is verified by rigorous simulations based on rigorous coupled wave analysis, which demonstrate also the angle and polarization insensitivity of the absorption properties of such a structure. Employing the MIM approach and results, we also investigate and demonstrate multiple perfect absorption bands and broad-band absorption in properly designed multilayer metal-insulator systems.
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