期刊
OPTICS EXPRESS
卷 31, 期 3, 页码 4482-4496出版社
Optica Publishing Group
DOI: 10.1364/OE.477343
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In this study, elongated Type I modifications in fused silica were achieved through deep focusing radiation of a femtosecond laser, resulting in axial lengths greater than 50 μm. The transition from Type II modification to Type I modification was observed as focusing depth increased. By overlapping modifications in the radial and axial directions, a 1D phase grating in the depth range of 2-5 mm was created, enabling efficient beam splitting.
In this study, we demonstrate the elongated Type I modifications in fused silica with an axial length > 50 mu m. Such extended longitudinal dimensions were obtained by deep focusing radiation of a femtosecond laser inside fused silica at a depth of 2 mm. The transition from the Type II modification (nanogratings) to the Type I modification (refraction index change) was observed with increasing focusing depth at the constant pulse energy. The refractive index changes of similar to 1.5x10(-3) for a single pass and 2.4x10(-3) for multiple passes were demonstrated. The radial dimensions of the deep-focused modifications were confined to 0.5-1.5 mu m size. By overlapping the modifications in radial and axial directions, 1D phase grating in the depth range from 2 to 5 mm was recorded, allowing to split of the beam with a diffraction efficiency of > 96%. We demonstrate that the aberration-based recording with a Gaussian beam in fused silica is a simple tool for fabricating complex phase diffractive optical elements. (c) 2023 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
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