Generation and decay of surface charge in a background charge environment during surface dielectric barrier discharges

Previously, we reported on the decay mechanism of the positive charge filaments generated by the first microdischarge during surface dielectric barrier discharges using a high-speed camera combined with the Pockels effect of a bismuth silicon oxide crystal. With the existing work, the next milestone is achieved by using this powerful approach to the generation and decay of surface charge in a background charge environment. It is found that the generation locations of new positive charge filaments are influenced by the surface charge memory effect. The background charge environment is an important factor in the decay of surface charge.

Automated summary

This article reports on the decay mechanism of positive charge filaments in surface dielectric barrier discharges, observed using a high-speed camera and the Pockels effect of a bismuth silicon oxide crystal. The study finds that the generation of new positive charge filaments is influenced by the surface charge memory effect and the background charge environment plays a crucial role in the decay of surface charge.