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Philip G. Neudeck et al.
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Thermal stability of Ni/Ti/Al ohmic contacts to p-type 4H-SiC
Hailong Yu et al.
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F. Laariedh et al.
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M. Siad et al.
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Luigia Lanni et al.
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Bohumil Barda et al.
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Z. Zhang et al.
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Petr Machac et al.
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Ti/Ni bilayer Ohmic contact on 4H-SiC
Takasumi Ohyanagi et al.
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R Konishi et al.
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