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Theoretical prediction of strain-induced carrier effective mass modulation in 4H-SiC and GaN
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Self-powered GaN ultraviolet photodetectors with p-NiO electrode grown by thermal oxidation
Liuan Li et al.
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Demonstration of 4H-SiC Digital Integrated Circuits Above 800 °C
Philip G. Neudeck et al.
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Dean P. Hamilton et al.
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A. V. Kuchuk et al.
ADVANCES IN CONDENSED MATTER PHYSICS (2016)
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Characterization of tungsten-nickel simultaneous Ohmic contacts to p- and n-type 4H-SiC
K. C. Kragh-Buetow et al.
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Thermal stability of Ni/Ti/Al ohmic contacts to p-type 4H-SiC
Hailong Yu et al.
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Electrical properties of TiN on gallium nitride grown using different deposition conditions and annealing
Liuan Li et al.
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The role of nickel and titanium in the formation of ohmic contacts on p-type 4H-SiC
F. Laariedh et al.
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Role of carbon in the formation of ohmic contact in Ni/4H-SiC and Ni/Ti/4H-SiC
M. Siad et al.
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Design and Characterization of High-Temperature ECL-Based Bipolar Integrated Circuits in 4H-SiC
Luigia Lanni et al.
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Origin of ohmic behavior in Ni, Ni2Si and Pd contacts on n-type SiC
Bohumil Barda et al.
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A Novel Tungsten-Nickel Alloy Ohmic Contact to SiC at 900 °C
R. S. Okojie et al.
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Kinetic study of interfacial solid state reactions in the Ni/4H-SiC contact
Z. Zhang et al.
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T. Prasada Rao et al.
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Ariel Virshup et al.
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Structural characterization of nickel-titanium film on silicon carbide
Petr Machac et al.
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Ti/Ni bilayer Ohmic contact on 4H-SiC
Takasumi Ohyanagi et al.
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Catalytic graphitization and Ohmic contact formation on 4H-SiC
WJ Lu et al.
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Development of Ni/Al and MUM ohmic contact materials for p-type 4H-SiC
R Konishi et al.
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Raman study on the Ni/SiC interface reaction
E Kurimoto et al.
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Fabrication and characterization of pulse laser deposited Ni2Si Ohmic contacts on n-SiC for high power and high temperature device applications
MW Cole et al.
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