In-plane resistive anisotropy in Ca2RuO4 measured by rotational square four-point probe method

The resistivity of materials is a fundamental property of solids and is widely used to understand underlying physics as well as to engineer device applications. Conventional four-probe measurement is usually employed to exclude the contributions from parasitic contact resistances. Here, we evaluate the in-plane resistive anisotropy in Ca2RuO4 crystals by using a rotational square four-point probe (4PP) method, which measures an angular dependence of the resistance to precisely detect the resistive anisotropy of materials. A clear sinusoidal dependence of the resistance has been observed, confirming the resistive anisotropy in this system. Finally, the resistance data is fitted with a theoretical angle dependence equation to extract the resistive anisotropy. The observed results are found to be matching with the actual resistivity of the sample.

Automated summary

The resistivity of materials is a fundamental property of solids and is widely used in both physics and engineering applications. In this study, a rotational square four-point probe method was used to evaluate the in-plane resistive anisotropy of Ca2RuO4 crystals. The results showed a clear sinusoidal dependence of resistance, confirming the resistive anisotropy in the system. The resistance data was fitted with a theoretical equation to extract the resistive anisotropy, which matched with the actual resistivity of the sample.