期刊
JOURNAL OF NUCLEAR MATERIALS
卷 481, 期 -, 页码 62-65出版社
ELSEVIER
DOI: 10.1016/j.jnucmat.2016.08.028
关键词
Grain boundary; Nanocrystalline iron; In-situ TEM; Void interaction
资金
- DOE Basic Energy Sciences [DE-SC0008274]
- Department of Energy Nuclear Energy Advanced Modeling and Simulation program
- U.S. Department of Energy (DOE) [DE-SC0008274] Funding Source: U.S. Department of Energy (DOE)
In-situ transmission electron microscopy (TEM) annealing experiments, coupled with an analytical model, compared void pinning effects in nanocrystalline Fe films during grain growth. Voided grain boundaries were shown to have nearly four orders of magnitude less grain boundary mobility than void-free grain boundaries. However the coverage of the grain boundaries by pores was over three times that which would be required for static particles to completely halt grain boundary migration. Grain boundary migration continued because the pores were dragged by the grain boundaries and continued to evolve and coalesce. Thus, pores can slow grain boundary migration but are not an effective means of fully stabilizing nanocrystalline grain size at high temperatures. (C) 2016 Elsevier B.V. All rights reserved.
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