期刊
JOURNAL OF NUCLEAR MATERIALS
卷 475, 期 -, 页码 274-279出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.jnucmat.2016.04.009
关键词
In situ ion irradiation; Heavy ion irradiation; Immiscible interfaces; Cu/Fe multilayers; Size effect
资金
- NSF [DMR-1304101]
- Division of Materials Science and Engineering, Office of Basic Energy Sciences, U.S. Department of Energy
- U.S. Department of Energy's National Nuclear Security Administration [DE-AC04-94AL85000]
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [1643915] Funding Source: National Science Foundation
Recent studies show that immiscible metallic multilayers with incoherent interfaces can effectively reduce defect density in ion irradiated metals by providing active defect sinks that capture and annihilate radiation induced defect clusters. Although it is anticipated that defect density within the layers should vary as a function of distance to the layer interface, there is, to date, little in situ TEM evidence to validate this hypothesis. In this study monolithic Cu films and Cu/Fe multilayers with individual layer thickness, h, of 100 and 5 nm were subjected to in situ Cu ion irradiation at room temperature to nominally 1 displacement-per-atom inside a transmission electron microscope. Rapid formation and propagation of defect clusters were observed in monolithic Cu, whereas fewer defects with smaller dimensions were generated in Cu/Fe multilayers with smaller h. Furthermore in situ video shows that the cumulative defect density in Cu/Fe 100 nm multilayers indeed varies, as a function of distance to the layer interfaces, supporting a long postulated hypothesis. (C) 2016 Elsevier B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据