4.6 Article

Gallium phosphide-on-insulator integrated photonic structures fabricated using micro-transfer printing

期刊

OPTICAL MATERIALS EXPRESS
卷 12, 期 9, 页码 3731-3737

出版社

Optica Publishing Group
DOI: 10.1364/OME.461146

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资金

  1. Agence Nationale de la Recherche [17-CE24-0019]
  2. Fonds De La Recherche Scientifique-FNRS
  3. European Research Council [726420, 757800, 759483]
  4. European Research Council (ERC) [757800, 759483, 726420] Funding Source: European Research Council (ERC)

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We demonstrate the transfer of gallium phosphide layers to an oxidized silicon wafer using micro-transfer printing, enabling versatile integration on an insulating substrate. Proof of concept is achieved with the fabrication of gallium phosphide-on-insulator ring resonators with high Q-factors up to 35,000.
Gallium phosphide-on-insulator emerged recently as a promising platform for integrated nonlinear photonics due to its intrinsic material properties. However, current integration solutions, using direct die-to-wafer bonding, do not support spatially localized integration with CMOS circuits which induce a large and expensive footprint material need. Here we demonstrate the transfer of gallium phosphide layers to an oxidized silicon wafer using micro-transfer printing as a new approach for versatile future (hybrid) integration. Using this novel approach, we demonstrate as a proof of concept the fabrication of gallium phosphide-on-insulator ring resonators with Q-factors as high as 35,000.(c) 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement

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