期刊
OPTICAL MATERIALS EXPRESS
卷 12, 期 9, 页码 3731-3737出版社
Optica Publishing Group
DOI: 10.1364/OME.461146
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资金
- Agence Nationale de la Recherche [17-CE24-0019]
- Fonds De La Recherche Scientifique-FNRS
- European Research Council [726420, 757800, 759483]
- European Research Council (ERC) [757800, 759483, 726420] Funding Source: European Research Council (ERC)
We demonstrate the transfer of gallium phosphide layers to an oxidized silicon wafer using micro-transfer printing, enabling versatile integration on an insulating substrate. Proof of concept is achieved with the fabrication of gallium phosphide-on-insulator ring resonators with high Q-factors up to 35,000.
Gallium phosphide-on-insulator emerged recently as a promising platform for integrated nonlinear photonics due to its intrinsic material properties. However, current integration solutions, using direct die-to-wafer bonding, do not support spatially localized integration with CMOS circuits which induce a large and expensive footprint material need. Here we demonstrate the transfer of gallium phosphide layers to an oxidized silicon wafer using micro-transfer printing as a new approach for versatile future (hybrid) integration. Using this novel approach, we demonstrate as a proof of concept the fabrication of gallium phosphide-on-insulator ring resonators with Q-factors as high as 35,000.(c) 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
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