期刊
THIN SOLID FILMS
卷 762, 期 -, 页码 -出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2022.139545
关键词
Dielectric function modeling; Parameterization; Spline functions; Knot placement; Information criteria; Spectroscopic ellipsometry
This paper presents a systematic approach using statistical estimators to optimize B-spline models for accurate modeling of material optical functions. The approach combines a specific knot allocation method with a selection strategy for the number of knots, replacing the traditional trial-and-error strategy.
Currently, a Kramers-Kronig consistent B(asis)-spline representation of the dielectric function is an efficient and widely used method for accurate modeling of the material optical functions in ellipsometric data analysis. However, the B-spline approach to the dielectric function modeling should include an appropriate and user -independent way of a knot vector generation, i.e., the proper selection of the number and locations of knots. In this paper, we advocate for a systematic approach which combines a specific knot allocation method, based on so-called Integral Span, a slope-weighting factor, with a selection of optimal number of knots using the Akaike and Bayesian Information Criteria, two statistical estimators, thereby replacing an intuitive and time-consuming trial-and-error strategy. The proposed hybrid approach is used to optimize the B-spline models for an epitaxial cobalt disilicide (CoSi2) thin film and a crystalline silicon substrate (c-Si).
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