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Inaccuracies in contact resistivity from the Cox-Strack method: A review

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ELSEVIER
DOI: 10.1016/j.solmat.2022.111909

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Electrical characterization; Solar cells; Contact resistivity; Measurement errors; Metal-semiconductor junctions; Test structures; Photovoltaics

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This paper reviews literature published from 2017 to 2021 on the Cox-Strack method for contact resistivity determination in photovoltaic cell engineering. It analyzes possible inaccuracies in the method and suggests that more than half of the reviewed articles may require additional analysis for accurate quantification of lower contact resistance values. The paper concludes with recommendations for improving the Cox-Strack methodology.
Recently, the Cox-Strack method for contact resistivity determination is increasingly used in the context of photovoltaic cell engineering. This document reviews the literature published in the period 2017-2021 containing Cox-Strack measurement results. As the Cox-Strack method is error-prone, we analyze this literature on the possible inaccuracies that may arise due to (1) approximations by Cox and Strack, (2) the choice of contact diameters, and (3) resistive coatings. On the basis of our findings, more than half of the 93 reviewed articles may need additional analysis for an accurate quantification of the lower reported contact resistance values. The article concludes with recommendations for an improved Cox-Strack methodology.

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