期刊
SENSORS
卷 22, 期 17, 页码 -出版社
MDPI
DOI: 10.3390/s22176669
关键词
dissolved oxygen; hydrogen ion; multimodal sensing; ISFET; solid-state sensor; potentiometric sensing
资金
- Japan Society for the Promotion of Science [18H03778, 21H01390]
- OPERA from the Japan Science and Technology Agency [JPMJOP1834]
This paper investigates the possibility of measuring dissolved oxygen using a solid-state semiconductor sensor. By fabricating SnO2-gate FET and Si3N4-gate FET, the experimental results show that SnO2 thin films have the ability to sense dissolved oxygen with high sensitivity.
We examined the possibility of measuring dissolved oxygen by using a potentiometric solid-state semiconductor sensor. Thin films of tin (IV) oxide (SnO2) are widely used in oxygen gas sensors. However, their ability to detect dissolved oxygen (DO) in solutions is still unknown. In this paper, we present a method for investigating the dissolved oxygen-sensing properties of SnO2 thin films in solutions by fabricating a SnO2-gate field-effect transistor (FET). A similarly structured hydrogen ion-sensitive silicon nitride (Si3N4)-gate FET was fabricated using the same method. The transfer characteristics and sensitivities were experimentally obtained and compared. The transfer characteristics of the FET show a shift in threshold voltage in response to a decrease in DO concentration. The SnO2-gate FET exhibited a sensitivity of 4 mV/ppm, whereas the Si3N4-gate FET showed no response to DO. Although the SnO2-gate FET responds to pH changes in the solution, this sensitivity issue can be eliminated by using a Si3N4-gate FET, which is capable of selectively sensing hydrogen ions without DO sensitivity. The experimental results indicate the promising properties of SnO2 thin films for multimodal sensing applications.
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