期刊
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ELSEVIER
DOI: 10.1016/j.nima.2022.167398
关键词
Perovskites; X-ray; Detector; Potassium chloride
Organometal halide perovskites are potential materials for X-ray detection due to their great properties and low cost. However, ion migration is a major obstacle for their application, especially migration via surface which degrades device performances. This paper demonstrates that a KCl passivation layer can effectively passivate surface traps and improve electrical performance of MAPbI(3) devices.
Organometal halide perovskites have proven to be potential materials for X-ray detection due to their great photoelectric properties, high radiation attenuation and low-cost preparation. However, ion migration is one of the obstacles for its applications, especially, ion migration via surface is much easier in single crystal materials than bulk diffusion which could significantly degrade the device performances. In this paper, the KCl passivation layer is prepared by the thermal evaporation method and inserted between crystal and electrode The trap density and mu tau product of pristine and KCl passivated MAPbI(3) devices are compared, and the results demonstrate KCl as a passivation layer can effectively passivate the surface traps and improve electrical performance. The KCl passivated MAPbI(3 )detector exhibits a high X-ray sensitivity of 3700 mu C Gy(air)(-1) cm(-2) under -20 V bias.
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