Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM

A decade ago, a statistics-based method was introduced to count the number of atoms from annular dark-field scanning transmission electron microscopy (ADF STEM) images. In the past years, this method was successfully applied to nanocrystals of arbitrary shape, size, and composition (and its high accuracy and precision has been demonstrated). However, the counting results obtained from this statistical framework are so far presented without a visualization of the actual uncertainty about this estimate. In this paper, we present three approaches that can be used to represent counting results together with their statistical error, and discuss which approach is most suited for further use based on simulations and an experimental ADF STEM image.

Automated summary

This paper introduces a statistical method to count the number of atoms in ADF STEM images and discusses how to represent the counting results together with their statistical error. Three approaches are presented and their suitability for further use is evaluated based on simulations and experimental images.