期刊
MICROELECTRONICS RELIABILITY
卷 138, 期 -, 页码 -出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.microrel.2022.114612
关键词
CIGS solar cells; Mo substrate; ITO substrate; Pulsed forward current stress
资金
- Fondo per la ricerca di sistema elettrico PTR 2019-2021. Project: Fotovoltaico ad alta efficienza
- [PTR 2019-2021]
The main objective of this paper is to compare the stability over time of two different types of Cu(In,Ga)Se2 solar cells, and to monitor and explain their performance differences through a forward pulse current stress test.
The main goal of this paper is to compare the stability over time of two different kinds of Cu(In,Ga)Se2 solar cells: the first is designed with a molybdenum back contact, the second has a semi-transparent back contact based on ITO (Indium Tin Oxide).To achieve this goal, we subjected two different samples to a forward pulse current stress during which the main electric cell parameters (i.e. Isc, Voc, PCE, IV characteristic) were monitored. Based on the collected results, we propose a physical interpretation to explain the different behaviours shown by the samples during degradation.
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