期刊
JOURNAL OF PHYSICAL CHEMISTRY B
卷 126, 期 40, 页码 8072-8079出版社
AMER CHEMICAL SOC
DOI: 10.1021/acs.jpcb.2c04541
关键词
-
资金
- National Science Centre (Poland) [UMO-2021/43/D/ST5/01114]
In this study, the influence of surface roughness on the properties of vapor-deposited glass and the effect of film confinement on changing surface roughness values were investigated using dielectric spectroscopy.
The substrate roughness is a very important parameter that can influence the properties of supported thin films. In this work, we investigate the effect of surface roughness on the properties of a vapor-deposited glass (celecoxib, CXB) both in its bulk and in confined states. Using dielectric spectroscopy, we provide experimental evidence depicting a profound influence of surface roughness on the alpha-relaxation dynamics and the isothermal crystallization of this vapor-deposited glass. Besides, we have verified the influence of film confinement on varying values of surface roughnesses as well. At a fixed surface roughness value, the confinement could alter both the dynamics and crystallization of vapor-deposited CXB.
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