期刊
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
卷 33, 期 29, 页码 22706-22707出版社
SPRINGER
DOI: 10.1007/s10854-022-08988-y
关键词
-
In the above-mentioned paper, the authors claimed to have used the envelope method for calculating the film thickness and refractive index. However, we observed smooth transmittance curves without any interference fringes, indicating a scientific error.
In the paper titled above [Najim et al. in J. Mater. Sci.: Mater. Electron., 2022], there is a fatal scientific error, as the authors claim that they used the envelope method in the calculation of the film thickness and the refractive index while we find that the transmittance curves (See Fig. 5 in [Najim et al. in J. Mater. Sci.: Mater. Electron., 2022]) are smooth and free from any interference fringes (maxima (T-M) or minima (T-m)), how was that done? Where are the T-M and T-m values? How do the authors use Eqs. 4-6 in their paper [Najim et al. in J. Mater. Sci.: Mater. Electron., 2022]?
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据