相关参考文献
注意：仅列出部分参考文献，下载原文获取全部文献信息。Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors
F. Ponce et al.
JOURNAL OF LOW TEMPERATURE PHYSICS (2020)
Absorption of light dark matter in semiconductors
Yonit Hochberg et al.
PHYSICAL REVIEW D (2017)
Improved EDELWEISS-III sensitivity for low-mass WIMPs using a profile likelihood approach
L. Hehn et al.
EUROPEAN PHYSICAL JOURNAL C (2016)
Direct detection of sub-GeV dark matter with semiconductor targets
Rouven Essig et al.
JOURNAL OF HIGH ENERGY PHYSICS (2016)
Direct detection constraints on dark photon dark matter
Haipeng An et al.
PHYSICS LETTERS B (2015)
Physical interpretation of the Neganov-Luke and related effects
MP Chapellier et al.
PHYSICA B (2000)
分享论文
