期刊
JOURNAL OF ELECTRONIC MATERIALS
卷 51, 期 12, 页码 7337-7352出版社
SPRINGER
DOI: 10.1007/s11664-022-09891-2
关键词
Electron microscopy; intermetallics; tin-lead solder; embrittlement; interfaces
资金
- U.S. Department of Energy's National Nuclear Security Administration [DE-NA0003525]
- U.S. Department of Energy (DOE) [DE-NA0003525]
This study fills the knowledge gap in solder joint gold embrittlement through investigating the impact of Au layer thickness on the mechanical performance of solder joints. The findings reveal the influence of Au content on the mechanical strength of joints and its primary mechanism.
Although gold remains a preferred surface finish for components used in high-reliability electronics, rapid developments in this area have left a gap in the fundamental understanding of solder joint gold (Au) embrittlement. Furthermore, as electronic designs scale down in size, the effect of Au content is not well understood on increasingly smaller solder interconnections. As a result, previous findings may have limited applicability. The current study focused on addressing these gaps by investigating the interfacial microstructure that evolves in 63Sn-37Pb solder joints as a function of Au layer thickness. Those findings were correlated to the mechanical performance of the solder joints. Increasing the initial Au concentration decreased the mechanical strength of a joint, but only to a limited degree. Kirkendall voids were the primary contributor to low-strength joints, while brittle fracture within the intermetallic compounds (IMC) layers is less of a factor. The Au embrittlement mechanism appears to be self-limiting, but only once mechanical integrity is degraded. Sufficient void evolution prevents continued diffusion from the remaining Au.
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