4.3 Article

Geostationary operational environmental satellite-R advanced baseline imager reflective solar band absolute validation using Sonoran desert scenes

期刊

JOURNAL OF APPLIED REMOTE SENSING
卷 16, 期 3, 页码 -

出版社

SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
DOI: 10.1117/1.JRS.16.034530

关键词

calibration; vicarious validation; bidirectional reflectance distribution function; GEO-GEO comparison

资金

  1. NASA Geostationary Instrument Support Team, ROSES [19-ESROGSS-19-0117]

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This study developed a vicarious validation technique for GOES-16 and GOES-17 satellites' ABIs data to improve imaging and reduce radiometric uncertainties. The technique used desert surface reflectance data to generate predicted radiance for comparison with ABI observations to detect changes and monitor stability.
The advanced baseline imagers (ABIs) on board the geostationary operational environmental satellite (GOES)-R series, GOES-16 and GOES-17 satellites, have accumulated long data series that have been updated throughout their missions to enhance their utility for imaging the Earth's weather, oceans, and environment. In preparing for a reprocessing effort aimed at improving the consistency and image quality and reducing radiometric uncertainties necessary for some Earth science applications, we developed a vicarious validation technique for five of the six reflective solar bands. This technique uses Sonoran desert surface reflectance data derived from the moderate resolution imaging spectrometer bidirectional reflectance distribution function parameters product along with other atmospheric products to generate a predicted at-sensor radiance for both GOES-16 and GOES-17 for comparison with ABI observations and to enable ABI intercomparisons. This technique identified known instrument biases and demonstrated absolute validation over the course of a year, showing its capability to detect changes, monitor stability, and assess radiometric uncertainties for operational data applications and future reprocessed data sets. (C) 2022 Society of Photo-Optical Instrumentation Engineers (SPIE)

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