4.8 Article

Visualizing In-Plane Junctions in Nitrogen-Doped Graphene

期刊

ADVANCED FUNCTIONAL MATERIALS
卷 32, 期 47, 页码 -

出版社

WILEY-V C H VERLAG GMBH
DOI: 10.1002/adfm.202208048

关键词

graphene; nitrogen dopants; p-n junctions; scanning tunneling microscopy

资金

  1. ANR
  2. MOST [ANR-20-CE09-0023, MOST 110-2923-M-002 -010]
  3. CNRS through the MITI interdisciplinary programs
  4. European Union's Horizon 2020 research and innovation program [766726]
  5. Danish IRFD

向作者/读者索取更多资源

This study demonstrates the realization of nanopatterning of nitrogen dopants in graphene by using a submonolayer of self-assembled physisorbed molecules as a resist during post-synthesis nitrogen doping process. The resulting domains with different nitrogen concentrations enable the formation of n-n' and p-n junctions in graphene. The electronic properties of the junctions were measured at the atomic scale using scanning tunneling microscopy, revealing an intrinsic width of approximately 7 nm corresponding to a sharp junction regime.
Controlling the spatial distribution of dopants in graphene is the gateway to the realization of graphene-based electronic components. Here, it is shown that a submonolayer of self-assembled physisorbed molecules can be used as a resist during a post-synthesis nitrogen doping process to realize a nanopatterning of nitrogen dopants in graphene. The resulting formation of domains with different nitrogen concentrations allows obtaining n-n' and p-n junctions in graphene. A scanning tunneling microscopy is used to measure the electronic properties of the junctions at the atomic scale and reveal their intrinsic width that is found to be approximate to 7 nm corresponding to a sharp junction regime.

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