3.8 Article

Multilevel effective material approximation for modeling ellipsometric measurements on complex porous thin films

期刊

ADVANCED OPTICAL TECHNOLOGIES
卷 11, 期 3-4, 页码 137-147

出版社

WALTER DE GRUYTER GMBH
DOI: 10.1515/aot-2022-0007

关键词

electrochemical catalysts; mixed metal oxide; multi-sample analysis; spectroscopic ellipsometry; thin mesoporous films

类别

资金

  1. project ATMOC [20IND04]
  2. EMPIR programme
  3. European Union
  4. DFG [SPP2080 (406695057)]
  5. BMBF project ATO-KAT [03EK3052A]

向作者/读者索取更多资源

Catalysts are crucial in chemical processes as they impact the rate, efficiency, and selectivity of reactions by lowering the activation energy. However, the complexity of catalyst materials makes it challenging to evaluate their physicochemical properties accurately. In this study, a vacuum-free and non-destructive analytical approach using multi-sample spectroscopic ellipsometry was introduced to determine important material parameters of mesoporous catalyst films.
Catalysts are important components in chemical processes because they lower the activation energy and thus determine the rate, efficiency and selectivity of a chemical reaction. This property plays an important role in many of today's processes, including the electrochemical splitting of water. Due to the continuous development of catalyst materials, they are becoming more complex, which makes a reliable evaluation of physicochemical properties challenging even for modern analytical measurement techniques and industrial manufacturing. We present a fast, vacuum-free and non-destructive analytical approach using multi-sample spectroscopic ellipsometry to determine relevant material parameters such as film thickness, porosity and composition of mesoporous IrOx-TiOy films. Mesoporous IrOx-TiOy films were deposited on Si wafers by sol- gel synthesis, varying the composition of the mixed oxide films between 0 and 100 wt%(Ir). The ellipsometric modeling is based on an anisotropic Bruggeman effective medium approximation (a-BEMA) to determine the film thickness and volume fraction of the material and pores. The volume fraction of the material was again modeled using a Bruggeman EMA to determine the chemical composition of the materials. The ellipsometric fitting results were compared with complementary methods, such as scanning electron microscopy (SEM), electron probe microanalysis (EPMA) as well as environmental ellipsometric porosimetry (EEP).

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

3.8
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据