4.5 Article

Improved Carrier-Envelope Phase Determination Method for Few-Cycle Laser Pulses Using High-Order Above-Threshold Ionization

期刊

PHOTONICS
卷 9, 期 8, 页码 -

出版社

MDPI
DOI: 10.3390/photonics9080528

关键词

high-order above-threshold ionization; few-cycle pulses; strong-field physics; carrier-envelope phase

类别

资金

  1. National Key Research and Development Program of China [2019YFA0307700]
  2. National Natural Science Foundation of China [11834015, 11974383, 12121004]
  3. Science and Technology Department of Hubei Province [2019CFA035, 2020CFA029]

向作者/读者索取更多资源

Recent studies show that the stereo-ATI carrier-envelope phase meter is an effective method for determining the carrier-envelope phase of few-cycle laser pulses, but current methods discard some data containing important CEP information. A new improved method has been developed in this work to effectively utilize most of the experimental data, achieving a CEP precision of 57 mrad over the entire 2 pi range for 5.0 fs laser pulses.
Recent studies indicate that the stereo-ATI carrier-envelope phase meter (CEPM) is an effective method to determine the carrier-envelope phase (CEP) of each and every single few-cycle laser pulse. In this method, a two-dimensional parametric asymmetry plot (PAP), which can be obtained with the measured data in two short time-of-flight intervals, is applied to extract the CEP. Thus, part of the data containing useful CEP information is discarded in the PAP method. In this work, an improved method was developed to effectively exploit most of the experimental data. By this method, we achieve a CEP precision of 57 mrad over the entire 2 pi range for 5.0 fs laser pulses.

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