期刊
JOURNAL OF SYNCHROTRON RADIATION
卷 29, 期 -, 页码 1209-1215出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577522007287
关键词
XEOL; XAS; CuInSe2; ZnO; GaN
资金
- German Federal Ministry of Education and Research [05K19OL1]
A newly designed setup for steady-state X-ray excited optical luminescence (XEOL) spectroscopy and simultaneous characterization of XEOL and X-ray absorption spectroscopy is described. The setup, located at beamline P65 of PETRA III, is equipped with a He-flow cryostat and state-of-the-art optical detection system, enabling a wide wavelength range and high spectral resolution for research on various samples.
A newly designed setup to perform steady-state X-ray excited optical luminescence (XEOL) spectroscopy and simultaneous XEOL and X-ray absorption spectroscopy characterization at beamline P65 of PETRA III is described. The XEOL setup is equipped with a He-flow cryostat and state-of-the-art optical detection system, which covers a wide wavelength range of 300-1700 nm with a high spectral resolution of 0.4 nm. To demonstrate the setup functioning, low-temperature XEOL studies on polycrystalline CuInSe2 thin film, single-crystalline GaN thin film and single-crystalline ZnO bulk semiconductor samples are performed.
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