High-resolution XEOL spectroscopy setup at the X-ray absorption spectroscopy beamline P65 of PETRA III

A newly designed setup to perform steady-state X-ray excited optical luminescence (XEOL) spectroscopy and simultaneous XEOL and X-ray absorption spectroscopy characterization at beamline P65 of PETRA III is described. The XEOL setup is equipped with a He-flow cryostat and state-of-the-art optical detection system, which covers a wide wavelength range of 300-1700 nm with a high spectral resolution of 0.4 nm. To demonstrate the setup functioning, low-temperature XEOL studies on polycrystalline CuInSe2 thin film, single-crystalline GaN thin film and single-crystalline ZnO bulk semiconductor samples are performed.

Automated summary

A newly designed setup for steady-state X-ray excited optical luminescence (XEOL) spectroscopy and simultaneous characterization of XEOL and X-ray absorption spectroscopy is described. The setup, located at beamline P65 of PETRA III, is equipped with a He-flow cryostat and state-of-the-art optical detection system, enabling a wide wavelength range and high spectral resolution for research on various samples.