期刊
SENSORS AND ACTUATORS A-PHYSICAL
卷 343, 期 -, 页码 -出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.sna.2022.113674
关键词
X-ray diffraction methods; Triple-crystal diffractometry; Adaptive bending X-ray optics; Time-resolved studies
资金
- Ministry of Science and Higher Education [075-15-2021-1362]
A new approach for fast recording Reciprocal Space Maps (RSM) of crystals is proposed in this study, which eliminates the use of mechanical systems. This approach utilizes two Adaptive Bending X-ray Optics (ABXO) elements made of lithium niobate crystals, placed at the positions of the monochromator and analyzer on a laboratory X-ray diffractometer. The experimental results demonstrate that the proposed technique enables fast and precise measurements of RSM, achieving significant improvements in both speed (up to 30 times) and accuracy (up to 3 times) of the obtained data. It opens up opportunities for studying the evolution of the defective structure of various prospective crystalline materials under external loading.
A new approach is proposed for fast recording Reciprocal Space Maps (RSM) of crystals without using mechanical systems. It is based on the simultaneous use of two Adaptive Bending X-ray Optics (ABXO) elements made of lithium niobate crystals located on a laboratory X-ray diffractometer at the positions of the monochromator and analyzer. The technique has been tested on a model silicon crystal. It was shown that the proposed technique allows fast and precision measurements of the RSM, providing significant progress both in speed (up to 30 times) and accuracy of the data (up to 3 times) obtained. It opens up opportunities for studying the evolution of the defective structure of various prospective crystalline materials under external loading.
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