期刊
OPTICS LETTERS
卷 47, 期 13, 页码 3283-3286出版社
Optica Publishing Group
DOI: 10.1364/OL.464102
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Terahertz radiation shows great potential for non-destructive inspection. Researchers have developed a method for imaging defects in chocolate bars using continuous wave sources and low-frequency detectors. By capturing diffraction images and solving the phase retrieval problem, they achieved diffraction-limited phase-contrast imaging and successfully identified contaminant particles with dimensions comparable to the wavelength.
Terahertz (THz) radiation has shown enormous potential for non-destructive inspection in many contexts. Here, we present a method for imaging defects in chocolate bars that can be extended to many other materials. Our method requires only a continuous wave (CW) monochromatic source and detector at relatively low frequencies (280 GHz) corresponding to a relatively long wavelength of 1.1 mm. These components are used to construct a common-path configuration enabling the capturing of several images of THz radiation diffracted by the test object at different axial depths. The captured diffraction-rich images are used to constrain the associated phase retrieval problem enabling full access to the wave field, i.e., real amplitude and phase distributions. This allows full-field diffraction-limited phasecontrast imaging. Thus, we experimentally demonstrate the possibility of identifying contaminant particles with dimensions comparable to thewavelength. (C) 2022 Optica Publishing Group
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