4.6 Article

Fundamental linewidth of an AlN microcavity Raman laser

期刊

OPTICS LETTERS
卷 47, 期 17, 页码 4295-4298

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Optica Publishing Group
DOI: 10.1364/OL.466195

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  1. National Natural Science Foundation of China [61975090, 62022080, 62175127]
  2. National Key Research and Development Program of China [2021YFB2801200]
  3. State Key Laboratory of Advanced Optical Communication Systems and Networks

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In this study, we measured the fundamental linewidth of a laser in high-quality crystalline microcavities, and found an inverse relationship with the emission power. We also derived the limit of the fundamental linewidth, independent of the Q-factor. These findings are important for the development of highly coherent chip-based lasers.
Raman lasing can be a promising way to generate highly coherent chip-based lasers, especially in high-quality (highQ) crystalline microcavities. Here, we measure the fundamental linewidth of a stimulated Raman laser in an aluminum nitride (AlN)-on-sapphire microcavity with a record Q-factor up to 3.7 million. An inverse relationship between fundamental linewidth and emission power is observed. A limit of the fundamental linewidth, independent of Q-factor, due to Raman-pump-induced Kerr parametric oscillation is derived. (c) 2022 Optica Publishing Group

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