期刊
OPTICS EXPRESS
卷 30, 期 18, 页码 31519-31529出版社
Optica Publishing Group
DOI: 10.1364/OE.454863
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资金
- Horizon 2020 Framework Programme [101007417]
In this study, we present a method to overcome manufacturing challenges in hard X-ray optics using a tailor-made refractive phase plate. With at-wavelength metrology and rapid prototyping, we demonstrate aberration correction for crossed multilayer Laue lenses, improving image quality significantly.
Diffraction-limited hard X-ray optics are key components for high-resolution microscopy, in particular for upcoming synchrotron radiation sources with ultra-low emittance. Diffractive optics like multilayer Laue lenses (MLL) have the potential to reach unprecedented numerical apertures (NA) when used in a crossed geometry of two one-dimensionally focusing lenses. However, minuscule fluctuations in the manufacturing process and technical limitations for high NA X-ray lenses can prevent a diffraction-limited performance. We present a method to overcome these challenges with a tailor-made refractive phase plate. With at-wavelength metrology and a rapid prototyping approach we demonstrate aberration correction for a crossed pair of MLL, improving the Strehl ratio from 0.41(2) to 0.81(4) at a numerical aperture of 3.3 x 10(-3). This highly adaptable aberration-correction scheme provides an important tool for diffraction-limited hard X-ray focusing. (C) 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
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