4.6 Article

Evidence for temporary and local transition of sp(2) graphite-type to sp(3) diamond-type bonding induced by the tip of an atomic force microscope

期刊

NEW JOURNAL OF PHYSICS
卷 24, 期 8, 页码 -

出版社

IOP Publishing Ltd
DOI: 10.1088/1367-2630/ac8570

关键词

atomic force microscopy; graphene; diamond; precision measurement

资金

  1. Deutsche Forschungsgemeinschaft [GRK 1570]

向作者/读者索取更多资源

This study presents a method for the transition from graphite to diamond on the atomic scale and reveals the local rehybridization of the structure during this transition. The experimental observation of harmonics at specific thresholds and force reduction provides evidence for the existence of this transition.
Artificial diamond is created by exposing graphite to pressures on the order of 10 GPa and temperatures of about 2000 K. Here, we provide evidence that the pressure exerted by the tip of an atomic force microscope onto graphene over the carbon buffer layer of silicon carbide can lead to a temporary transition of graphite to diamond on the atomic scale. We perform atomic force microscopy with CO terminated tips and copper oxide (CuOx) tips to image graphene and to induce the structural transition. A local transition induced by the force of the tip is accompanied by local rehybridization from an sp(2)-bonded to an sp(3)-bonded local structure. Density functional theory predicts that a repulsive threshold of approximate to 13 nN, followed by a force reduction by approximate to 4 nN is overcome when inducing the graphite-diamond transition. The experimental observation of the third harmonic with a magnitude of about 200 fm fits well to overcoming a force barrier of F-barrier approximate to 5 nN, followed by a force reduction by -F-barrier and an upswing by F-b(arrier) for decreasing distances. Experimental evidence for this transition is provided by the emergence of third harmonics in the cantilever oscillation when the laterally flexible CO terminated tip exerts a large repulsive force. Probing the sample with rigid CuOx tips in the strong repulsive regime shows a strong difference in the yielding of the A versus B sites to the pressure of the tip. The large repulsive overall force of approximate to 10 nN is only compatible with the experimental data if one assumes that the repulsive force acting on the tip when inducing the transition is compensated by a heavily increased van-der-Waals attraction of the tip due to form fitting of tip and sample by local indentation. The experiment also shows that atomic force microscopy allows to perform high pressure physics on the atomic scale.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据