4.4 Article

Effects of continuously or step-continuously graded buffer on the performance of wavelength extended InGaAs photodetectors

期刊

JOURNAL OF CRYSTAL GROWTH
卷 440, 期 -, 页码 1-5

出版社

ELSEVIER
DOI: 10.1016/j.jcrysgro.2016.01.016

关键词

Defects; Molecular beam epitaxy; Semiconducting III-V materials; Infrared devices

资金

  1. National Basic Research Program of China [2012CB619202]
  2. National Natural Science Foundation of China [61275113, 61204133, 61405232]

向作者/读者索取更多资源

High In content In0.83Ga0.17As photodetector structures with a new kind of buffer scheme have been grown on InP substrate by gas source molecular beam epitaxy. The effects of buffer scheme on material properties and device performances have been investigated both experimentally and theoretically. The structures with the combination of step and continuously graded buffers show reduced surface roughness, improved photoluminescence intensity and lower device dark current than those with simplex continuously graded buffer at the same buffer thickness. The mechanisms have been discussed from Xray diffraction, photoluminescence, dark current measurements and model analysis. (C) 2016 Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据