4.8 Article

Stability and Electronic Characteristics of Epitaxial Silicene Multilayers on Ag(111)

期刊

ADVANCED FUNCTIONAL MATERIALS
卷 25, 期 26, 页码 4083-4090

出版社

WILEY-V C H VERLAG GMBH
DOI: 10.1002/adfm.201501029

关键词

silicene; epitaxy; soft X-ray spectroscopy; 2D materials; DFT calculations

资金

  1. Natural Sciences and Engineering Research Council of Canada (NSERC)
  2. Canada Research Chair Program
  3. Russian Foundation for Basic Research [14-02-00006]
  4. NSERC
  5. National Research Council (Canada)
  6. Canadian Institutes of Health Research
  7. Province of Saskatchewan
  8. Western Economic Diversification Canada
  9. University of Saskatchewan

向作者/读者索取更多资源

In this study, the stability and electronic characteristics of epitaxial silicene bilayers and multilayers on the Ag(111) surface are investigated through synchrotron-based soft X-ray emission and absorption spectroscopy and first-principles, full-potential density functional theory simulations. The calculations predict a novel tristable AA-stacked bilayer structure that can explain the (3 x 3)R30 degrees honeycomb topography commonly observed through scanning tunneling microscopy and noncontact atomic force microscopy. It is reported that the electronic structure of this epitaxial bilayer is similar to those of epitaxial monolayers on Ag(111), namely, metallic and showing significant interaction with the underlying substrate. However, the soft X-ray spectroscopy experiments suggest that during multilayer growth a majority of the epitaxial silicon reverts to a bulk-like state, a result that has significant implications toward the existence of large-area epitaxial silicene multilayers.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.8
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据