Sensitive Silicon Nanowire Ultraviolet B Photodetector Induced by Leakage Mode Resonances

Ultraviolet photodetectors (UVPDs) have played an important role both in civil and military applications. While various studies have shown that traditional UVPDs based on wide-band-gap semiconductors (WBSs) have excellent device performances, it is, however, undeniable that the practical application of WBS-based UVPDs is largely limited by the relatively high fabrication cost. In this work, we propose a new silicon nanowire (Si NW) UVPD that is very sensitive to UVB light illumination. The Si NWs with a diameter of about 36 nm are fabricated by a metal-assisted chemical etching method. Performance analysis revealed that the Si NW device was only sensitive to UVB light and almost blind to illumination in the visible and near-infrared regions. Such abnormal spectral selectivity was associated with the leakage mode resonances (LMRs) of the small diameter, according to our theoretical simulation. Under 300 nm illumination, the responsivity, external quantum efficiency, and specific detectivity were estimated to be 10.2 AW(-1), 4.22 X 10(3)%, and 2.14 x 10(10) Jones, respectively, which were comparable to or even higher than those of some WBS-based UVPDs. These results illustrate that the small dimension Si NWs are potential building blocks for low-cost and high-performance UVPDs in the future.

Automated summary

In this study, a silicon nanowire (Si NW) ultraviolet photodetector (UVPD) was proposed, which exhibited high spectral selectivity and comparable or even better performance in terms of responsivity, external quantum efficiency, and specific detectivity compared to wide-band-gap semiconductor (WBS)-based UVPDs.