4.1 Review

Recent progress on advanced transmission electron microscopy characterization for halide perovskite semiconductors

期刊

JOURNAL OF SEMICONDUCTORS
卷 43, 期 4, 页码 -

出版社

IOP Publishing Ltd
DOI: 10.1088/1674-4926/43/4/041106

关键词

organic-inorganic hybrid perovskite solar cell materials; energy materials; scanning electron microscopy; transmission electron microscopy; irradiation damage

资金

  1. Beijing Municipal High Level Innovative Team Building Program [IDHT20190503]
  2. National Natural Science Fund for Innovative Research Groups of China [51621003]
  3. National Natural Science Foundation of China [12074017]

向作者/读者索取更多资源

This review summarizes recent studies on advanced transmission electron microscopy (TEM) characterizations of halide perovskites. It covers topics such as irradiation damage under conventional imaging conditions, low-dose TEM, atomic-resolution imaging, defects identification, chemical mapping, cryo-TEM, and in-situ TEM for degradation study. These characterizations help in understanding the structure-property relationship and degradation mechanism of halide perovskites, and aid in the design of more efficient and robust energy materials.
Halide perovskites are strategically important in the field of energy materials. Along with the rapid development of the materials and related devices, there is an urgent need to understand the structure-property relationship from nanoscale to atomic scale. Much effort has been made in the past few years to overcome the difficulty of imaging limited by electron dose, and to further extend the investigation towards operando conditions. This review is dedicated to recent studies of advanced transmission electron microscopy (TEM) characterizations for halide perovskites. The irradiation damage caused by the interaction of electron beams and perovskites under conventional imaging conditions are first summarized and discussed. Low-dose TEM is then discussed, including electron diffraction and emerging techniques for high-resolution TEM (HRTEM) imaging. Atomic-resolution imaging, defects identification and chemical mapping on halide perovskites are reviewed. Cryo-TEM for halide perovskites is discussed, since it can readily suppress irradiation damage and has been rapidly developed in the past few years. Finally, the applications of in-situ TEM in the degradation study of perovskites under environmental conditions such as heating, biasing, light illumination and humidity are reviewed. More applications of emerging TEM characterizations are foreseen in the coming future, unveiling the structural origin of halide perovskite's unique properties and degradation mechanism under operando conditions, so to assist the design of a more efficient and robust energy material.

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