相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Reflections on the Spatial Performance of Atom Probe Tomography in the Analysis of Atomic Neighborhoods
Baptiste Gault et al.
MICROSCOPY AND MICROANALYSIS (2022)
Monolithic infrared silicon photonics: The rise of (Si)GeSn semiconductors
O. Moutanabbir et al.
APPLIED PHYSICS LETTERS (2021)
Direct observation of chemical short-range order in a medium-entropy alloy
Xuefei Chen et al.
NATURE (2021)
Impact of Long-Term Annealing on Photoluminescence from Ge1-xSnx Alloys
Oluwatobi Olorunsola et al.
CRYSTALS (2021)
Short-range order and its impact on the CrCoNi medium-entropy alloy
Ruopeng Zhang et al.
NATURE (2020)
Electrically injected GeSn lasers on Si operating up to 100 K
Yiyin Zhou et al.
OPTICA (2020)
Atomic distributions observed in group IV-IV binary tetrahedron alloys: A revised analysis of SiGe and GeSn compounds
B. Robouch et al.
JOURNAL OF ALLOYS AND COMPOUNDS (2020)
Reduced Lasing Thresholds in GeSn Microdisk Cavities with Defect Management of the Optically Active Region
Anas Elbaz et al.
ACS PHOTONICS (2020)
Short-Range Order in GeSn Alloy
Boxiao Cao et al.
ACS APPLIED MATERIALS & INTERFACES (2020)
GeSn on Insulators (GeSnOI) Toward Mid-infrared Integrated Photonics
Xiaoxin Wang et al.
FRONTIERS IN PHYSICS (2019)
Three-dimensional nanoscale characterisation of materials by atom probe tomography
Arun Devaraj et al.
INTERNATIONAL MATERIALS REVIEWS (2018)
Atomically uniform Sn-rich GeSn semiconductors with 3.0-3.5 mu m room-temperature optical emission
S. Assali et al.
APPLIED PHYSICS LETTERS (2018)
Investigation of GeSn Strain Relaxation and Spontaneous Composition Gradient for Low-Defect and High-Sn Alloy Growth
Wei Dou et al.
SCIENTIFIC REPORTS (2018)
Deviations from Vegard's law in semiconductor thin films measured with X-ray diffraction and Rutherford backscattering: The Ge1-ySny and Ge1-xSix cases
Chi Xu et al.
JOURNAL OF APPLIED PHYSICS (2017)
Short-range atomic ordering in nonequilibrium silicon-germanium-tin semiconductors
S. Mukherjee et al.
PHYSICAL REVIEW B (2017)
An optically pumped 2.5 μm GeSn laser on Si operating at 110 K
Sattar Al-Kabi et al.
APPLIED PHYSICS LETTERS (2016)
Approaches for Promoting Accurate Atom Probe Reconstruction
T.J. Prosa et al.
MICROSCOPY AND MICROANALYSIS (2016)
Indium clustering in a-plane InGaN quantum wells as evidenced by atom probe tomography
Fengzai Tang et al.
APPLIED PHYSICS LETTERS (2015)
On the interplay between relaxation, defect formation, and atomic Sn distribution in Ge(1-x)Sn(x) unraveled with atom probe tomography
A. Kumar et al.
JOURNAL OF APPLIED PHYSICS (2015)
OPTOELECTRONICS The rise of the GeSn laser
Kevin P. Homewood et al.
NATURE PHOTONICS (2015)
Absorption coefficients of GeSn extracted from PIN photodetector response
Kaiheng Ye et al.
SOLID-STATE ELECTRONICS (2015)
Extended X-ray absorption fine structure investigation of Sn local environment in strained and relaxed epitaxial Ge1-xSnx films
F. Gencarelli et al.
JOURNAL OF APPLIED PHYSICS (2015)
Atomically resolved tomography to directly inform simulations for structure-property relationships
Michael P. Moody et al.
NATURE COMMUNICATIONS (2014)
Structural and optical characteristics of Ge1-xSnx/Ge superlattices grown on Ge-buffered Si(001) wafers
Jia-Zhi Chen et al.
OPTICAL MATERIALS EXPRESS (2014)
Quantitative Evaluation of Spinodal Decomposition in Fe-Cr by Atom Probe Tomography and Radial Distribution Function Analysis
Jing Zhou et al.
MICROSCOPY AND MICROANALYSIS (2013)
Atomic insight into Ge1-xSnx using atom probe tomography
Arul Kumar et al.
ULTRAMICROSCOPY (2013)
Reconstructing atom probe data: A review
Francois Vurpillot et al.
ULTRAMICROSCOPY (2013)
Short-range order in multicomponent materials
Anna V. Ceguerra et al.
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES (2012)
Toward Automated Optimization of Reconstruction of Atom Probe Data
D Larson et al.
MICROSCOPY AND MICROANALYSIS (2011)
Lattice Rectification in Atom Probe Tomography: Toward True Three-Dimensional Atomic Microscopy
Michael P. Moody et al.
MICROSCOPY AND MICROANALYSIS (2011)
Pragmatic reconstruction methods in atom probe tomography
F. Vurpillot et al.
ULTRAMICROSCOPY (2011)
Evolution of solute clustering in Al-Cu-Mg alloys during secondary ageing
R. K. W. Marceau et al.
ACTA MATERIALIA (2010)
Spatial Resolution in Atom Probe Tomography
Baptiste Gault et al.
MICROSCOPY AND MICROANALYSIS (2010)
A three-dimensional Markov field approach for the analysis of atomic clustering in atom probe data
Anna V. Ceguerra et al.
PHILOSOPHICAL MAGAZINE (2010)
Clustering and pair correlation function in atom probe tomography
T. Philippe et al.
ULTRAMICROSCOPY (2010)
Influence of field evaporation on Radial Distribution Functions in Atom Probe Tomography
D. Haley et al.
PHILOSOPHICAL MAGAZINE (2009)
Qualification of the tomographic reconstruction in atom probe by advanced spatial distribution map techniques
Michael P. Moody et al.
ULTRAMICROSCOPY (2009)
Clustering and nearest neighbour distances in atom-probe tomography
T. Philippe et al.
ULTRAMICROSCOPY (2009)
Quantitative binomial distribution analyses of nanoscale like-solute atom clustering and segregation in atom probe tomography data
Michael P. Moody et al.
MICROSCOPY RESEARCH AND TECHNIQUE (2008)
Band anticrossing in highly mismatched SnxGe1-x semiconducting alloys
K. Alberi et al.
PHYSICAL REVIEW B (2008)
New techniques for the analysis of fine-scaled clustering phenomena within atom probe tomography (APT) data
Leigh T. Stephenson et al.
MICROSCOPY AND MICROANALYSIS (2007)
Spatial distribution maps for atom probe tomography
Brian P. Geiser et al.
MICROSCOPY AND MICROANALYSIS (2007)
Contingency table techniques for three dimensional atom probe tomography
Michael P. Moody et al.
MICROSCOPY RESEARCH AND TECHNIQUE (2007)
ATHENA, ARTEMIS, HEPHAESTUS:: data analysis for X-ray absorption spectroscopy using IFEFFIT
B Ravel et al.
JOURNAL OF SYNCHROTRON RADIATION (2005)
Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probe
F Vurpillot et al.
JOURNAL OF MICROSCOPY (2004)
Deformation potential constants of biaxially tensile stressed Ge epitaxial films on Si(100)
JF Liu et al.
PHYSICAL REVIEW B (2004)
Structural analyses in three-dimensional atom probe: a Fourier transform approach
F Vurpillot et al.
JOURNAL OF MICROSCOPY (2001)