4.2 Article

Parameter estimation for X-ray scattering analysis with Hamiltonian Markov Chain Monte Carlo

期刊

JOURNAL OF SYNCHROTRON RADIATION
卷 29, 期 -, 页码 721-731

出版社

INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577522003034

关键词

small-angle X-ray scattering; X-ray reflectivity; Markov chain Monte Carlo

资金

  1. Advanced Photon Source, a US Department of Energy (DOE) Office of Science User Facility
  2. DOE Office of Science [DE-AC02-06CH11357]
  3. DOE Early Career Research Program
  4. US Department of Energy, Office of Science, Office of Basic Energy Sciences, Materials Science and Engineering Division

向作者/读者索取更多资源

This article discusses the application of Bayesian inference-based methods in X-ray scattering analysis, focusing on the Hamiltonian MCMC method and its advantages.
Bayesian-inference-based approaches, in particular the random-walk Markov Chain Monte Carlo (MCMC) method, have received much attention recently for X-ray scattering analysis. Hamiltonian MCMC, a state-of-the-art development in the field of MCMC, has become popular in recent years. It utilizes Hamiltonian dynamics for indirect but much more efficient drawings of the model parameters. We described the principle of the Hamiltonian MCMC for inversion problems in X-ray scattering analysis by estimating high-dimensional models for several motivating scenarios in small-angle X-ray scattering, reflectivity, and X-ray fluorescence holography. Hamiltonian MCMC with appropriate preconditioning can deliver superior performance over the random-walk MCMC, and thus can be used as an efficient tool for the statistical analysis of the parameter distributions, as well as model predictions and confidence analysis.

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