4.6 Article

Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

期刊

APPLIED SCIENCES-BASEL
卷 12, 期 10, 页码 -

出版社

MDPI
DOI: 10.3390/app12104888

关键词

ellipsometry; structural color; opal; polymers; optical modelling

资金

  1. Llywodraeth Cymru KESS-2 (European Social Fund)
  2. SPARC-II (European Regional Development Fund)

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The method of spectroscopic ellipsometry is used to investigate complex periodic nanomaterials with intense resonant structural color. A multilayer optical quasi-model is developed to understand the correlation between ellipsometric parameters and shear-induced crystallinity. These approaches provide reliable means for in-line tracking of sample quality in large scale processing and applications of such materials.
The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the increment and psi ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such polymer opals in large scale processing and applications.

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