期刊
LIGHT-SCIENCE & APPLICATIONS
卷 11, 期 1, 页码 -出版社
SPRINGERNATURE
DOI: 10.1038/s41377-022-00797-6
关键词
-
类别
资金
- Federal State of Thuringia [2017 FGR 0076]
- European Social Fund (ESF)
- Thuringer Aufbaubank (TAB) [FKZ: 2017 FGR 0076]
- European Research Council (ERC) under the European Union's Horizon 2020 research and innovation programm [835306]
- Fraunhofer Cluster of Excellence Advanced Photon Sources
Microscopy with extreme ultraviolet radiation offers high-resolution imaging and excellent material contrast, making it ideal for studying complex structures and material composition.
Microscopy with extreme ultraviolet (EUV) radiation holds promise for high-resolution imaging with excellent material contrast, due to the short wavelength and numerous element-specific absorption edges available in this spectral range. At the same time, EUV radiation has significantly larger penetration depths than electrons. It thus enables a nano-scale view into complex three-dimensional structures that are important for material science, semiconductor metrology, and next-generation nano-devices. Here, we present high-resolution and material-specific microscopy at 13.5 nm wavelength. We combine a highly stable, high photon-flux, table-top EUV source with an interferometrically stabilized ptychography setup. By utilizing structured EUV illumination, we overcome the limitations of conventional EUV focusing optics and demonstrate high-resolution microscopy at a half-pitch lateral resolution of 16 nm. Moreover, we propose mixed-state orthogonal probe relaxation ptychography, enabling robust phase-contrast imaging over wide fields of view and long acquisition times. In this way, the complex transmission of an integrated circuit is precisely reconstructed, allowing for the classification of the material composition of mesoscopic semiconductor systems.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据