The Performance of EDXS at Elevated Sample Temperatures Using a MEMS-Based In Situ TEM Heating System

Since the development of MEMS heating holders, dynamic in-situ experiments at elevated temperatures may be complemented by X-ray spectrometry for chemical analysis. Although the amount of IR radiation is small when compared to furnace holders, the influence of IR radiation emitted from the heating device on the quality of the X-ray spectra is significant. In this work, we systematically examine the influence of infrared (IR) radiation generated by MEMS-based in situ heating systems (DENSsolutions single-and double-tilt holders) on the results and interpretation of energy-dispersive X-ray (EDX) spectra through simulation and measurement. Focal points of interest in this study are the influence of holder geometry, shadowing and orientation with respect to the different emission characteristics of IR and X-ray photons and their interaction with a side-entry and a multi-detector system. IR photons substantially contribute to count rates, dead time, electronic noise levels, energy resolution, and detection efficiency of semiconductor detectors. At higher sample temperatures, they ultimately limit the feasibility of EDXS for elemental characterization and especially the traceability of low-Z elements. This work provides a quantitative insight into the influence of all relevant parameters related to in situ heating ex-periments on the spectral quality. Bearing this in mind, we aim to provide a guide to optimizing in situ heating experiments with respect to chemical EDXS analysis.

Automated summary

This article systematically investigates the influence of infrared radiation generated by MEMS-based in situ heating systems on the results and interpretation of energy-dispersive X-ray spectra. The study finds that IR photons significantly affect the count rates, dead time, electronic noise levels, energy resolution, and detection efficiency of semiconductor detectors, particularly limiting the traceability of low-Z elements at higher sample temperatures.