期刊
SENSORS
卷 22, 期 10, 页码 -出版社
MDPI
DOI: 10.3390/s22103869
关键词
singing capacitors; MLCC; acoustic noise; electronics design; PCB acoustics measurement methods; simulation; analysis; IoT sensors
资金
- Romanian Ministry of Research, Innovation and Digitalization [PFE 26/30.12.2021]
Multilayer Ceramic Capacitors (MLCCs) are widely used in modern electronic devices due to their small size, low cost, large capacitance range, and good frequency response. However, the main dielectric material used in MLCCs, Barium Titanate, causes the capacitors to vibrate, resulting in acoustic noise known as the "singing capacitors" phenomenon. This paper provides an up-to-date review of the measurements methodologies, solutions, and simulation methods for attenuating or eliminating the acoustic noise caused by MLCCs.
Multilayer Ceramic Capacitors (MLCC) have a major role in modern electronic devices due to their small price and size, large range of capacitance, small ESL and ESR, and good frequency response. Unfortunately, the main dielectric material used for MLCCs, Barium Titanate, makes the capacitors vibrate due to the piezoelectric and electrostrictive effects. This vibration is transferred to the PCB, making it resonate in the audible range of 20 Hz-20 kHz, and in this way the singing capacitors phenomenon occurs. This phenomenon is usually measured with a microphone, to measure the sound pressure level, or with a Laser Doppler Vibrometer (LDV), to measure the vibration. Besides this, other methods are mentioned in the literature, for example, the optical fiber and the active excitation method. There are several solutions to attenuate or even eliminate the acoustic noise caused by MLCC. Specially designed capacitors for low acoustic levels and different layout geometries are only two options found in the literature. To prevent the singing capacitor phenomenon, different simulations can be performed, the harmonic analysis being the most popular technique. This paper is an up-to-date review of the acoustic noise caused by MLCCs in electronic devices, containing measurements methodologies, solutions, and simulation methods.
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