期刊
RADIATION PHYSICS AND CHEMISTRY
卷 192, 期 -, 页码 -出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.radphyschem.2021.109917
关键词
Partially stabilized zirconia; Swift heavy ions; Transmission electron microscopy; XRD analysis; Indentation
资金
- Ministry of Science and Higher Education of the Russian Federation [FSWW-2020-0008]
- TPU development program Priority 2030
The paper investigates the impact of swift heavy Xe ion irradiation on partially stabilized zirconia ceramics. It finds that the efficiency of high-energy ion track formation decreases with increasing fluence and fraction of the t phase. Nanoindentation and microindentation techniques are used to study the changes in hardness, modulus, and microhardness of the ceramics. The mechanisms behind ceramic layer hardening are discussed, including phase rearrangement, compressive stress accumulation, and transformation and ferroelastic hardening.
The paper reports on the effect of irradiation by swift heavy Xe ions on partially stabilized zirconia ceramics. XRD analysis identified two tetragonal phases with different degrees of tetragonality (transformable t phase and non transformable metastable t phase). TEM analysis of the irradiated samples showed that the efficiency of highenergy ion track formation decreases when the fluence and, hence, the fraction of t phase increase. Changes in nanohardness, elastic modulus, and microhardness of partially stabilized ZrO2 ceramics before and after irradiation were investigated by nanoindentation and microindentation techniques. Mechanisms of ceramic layer hardening associated with phase rearrangement, compressive stress accumulation, and transformation and ferroelastic hardening are discussed.
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