期刊
JOURNAL OF APPLIED PHYSICS
卷 119, 期 21, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4953386
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资金
- U.S. Department of Energy's National Nuclear Security Administration [DE-AC04-94AL85000]
- Department of Energy's Office of Basic Research
- U.S. Government
A time- and temperature-dependent differential-transmission technique is used to study the bandgap dependence of Auger recombination in Ga-free InAs/InAsSb type-II superlattices (T2SLs). The bandgap energies are varied between 290 meV (4.3 mu m) and 135meV (9.2 mu m) by engineering the layer thickness and alloy Sb concentration. A long-wave infrared structure with 135meV bandgap energy is found to have an Auger coefficient of 9 x 10(-26) cm(6)/s at 77 K. The measured Auger coefficients increase with decreasing bandgap from approximately 3 x 10(-27) cm(6)/s for mid-wave infrared bandgaps to 2 x 10(-25) cm(6)/s for long-wave infrared bandgaps at 77 K. The measured T2SL Auger coefficients are compared to predicted Auger coefficients for HgCdTe. Published by AIP Publishing.
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