期刊
JOURNAL OF APPLIED PHYSICS
卷 120, 期 16, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4965989
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资金
- United Kingdom Engineering and Physical Sciences Research Council [EP/NO17927/1, EP/J003603/1]
- European Research Council under the European Community [279361]
- Royal Academy of Engineers/Leverhulme Trust
- EPSRC [EP/N017927/1, EP/J003603/1, EP/N01202X/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/J003603/1, EP/N017927/1, EP/N01202X/1] Funding Source: researchfish
Nano-cathodoluminescence (Nano-CL) reveals optical emission from individual InGaN quantum wells for applications in optoelectronic devices. We show the luminescent intensity decays over time with exposure to the electron beam for energies between 80 and 200 keV. Measurements of the CL intensity over time show an exponential decline in intensity, which we propose is due to the formation of nitrogen Frenkel defects. The measured CL damage decreases with reductions in the electron accelerating voltage and we suggest that the electron induced structural damage may be suppressed below the proposed damage threshold. The electron beam induced damage leads to a non-radiative region that extends over the measured minority carrier diffusion length. Nano-CL may thus serve as a powerful technique to study III-nitride optoelectronics. (C) 2016 Author(s).
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