A perspective survey on deep transfer learning for fault diagnosis in industrial scenarios: Theories, applications and challenges

Deep Transfer Learning (DTL) is a new paradigm of machine learning, which can not only leverage the advantages of Deep Learning (DL) in feature representation, but also benefit from the superiority of Transfer Learning (TL) in knowledge transfer. As a result, DTL techniques can make DL-based fault diagnosis methods more reliable, robust and applicable, and they have been widely developed and investigated in the field of Intelligent Fault Diagnosis (IFD). Although several systematic and valuable review articles have been published on the topic of IFD, they summarized relevant research only from an algorithm perspective and overlooked practical applications in industry scenarios. Furthermore, a comprehensive review on DTL-based IFD methods is still lacking. From this insight, it is particularly important and more necessary to comprehensively survey the relevant publications of DTL-based IFD, which will help readers to conveniently understand the current state-of-the-art techniques and to quickly design an effective solution for solving IFD problems in practice. First, theoretical backgrounds of DTL are briefly introduced to present how the transfer learning techniques can be integrated with deep learning models. Then, major applications of DTL and their recent developments in the field of IFD are detailed and discussed. More importantly, suggestions on how to select DTL algorithms in practical applications, and some future challenges are shared. Finally, conclusions of this survey are given. At last, we have reason to believe that the works done in this article can provide convenience and inspiration for the researchers who want to devote their efforts in the progress and advance of IFD.

Automated summary

Deep Transfer Learning combines the advantages of Deep Learning in feature representation and Transfer Learning in knowledge transfer, making DL-based fault diagnosis methods more reliable and robust. However, further research is needed to explore the potential of DTL-based approaches in Intelligent Fault Diagnosis.